Asian Journal of Research and Reviews in Physics

Fluorine doped tin oxide, Cadmium Sulphide  and Cadmium Telluride  thin films have been deposted on Soda Lime glass substrate at  respectively by spray pyrolysis (SP) technique and are important semiconductor materials in optoelectronic devices such as optical sensors, light-emitting diodes, transistors and photovoltaic cells.  thin films were characterized by various techniques such as X-ray diffraction, SEM and optical studies. X-ray diffraction measurements show that the deposited   was found to be of cassiterite type with tetragonal rutile structure, observation of peaks of different planes on an X-ray diffraction graph of  thin film showed that  film obtained were cubic structure. The main peak value of  thin film is seen at , which is the characteristic peak of the  compound  and the  film structure was obtained at the major peak  indicating the preferred orientation of  films along  direction. This confirms the formation of  thin film, with (111) as the strongest preferred plane of orientation. The surface morphology of the thin films was analysed by scanning electron microscopy (SEM). The optical energy band gap of thin films are determine  The results showed that the prepared FTO, CdS and CdTe films can be used in solar energy applications.